Surface Analysis with Scanning Electron Microscopy and X-ray Spectroscopy
- Surface condition/condition assessment - in new condition and after use or reprocessing - scanning electron microscopy (SEM)
- Homogeneity and removal of coatings
- Material determination - energy dispersive X-ray spectroscopy (EDX)
- Damage analysis
- Recognition of markings and inscriptions (e.g. UDI - Unique Device Identification)